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MEMS strain gauge sensor for structural monitoring

tir. 08. nov.

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Webinar

After an overview on the various strain gauge sensors commonly used in structural monitoring, the presentation will focus an ongoing research activity carried out at SINTEF Digital on a novel high performance MEMS strain gauge sensor.

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MEMS strain gauge sensor for structural monitoring
MEMS strain gauge sensor for structural monitoring

Time & Location

08. nov. 2022, 08:00 – 8:45

Webinar

About the Event

Extending the lifecycle of an asset, and also ensuring that the asset functions efficiently and without failure is a key concern for many businesses. This is now turning into an expanding market for condition monitoring sensors. 

Among the various parameters that could be monitored, strain is one of the most interesting since it is strongly connected to most failures affecting the reliability of infrastructures. However, such mechanical measurement is extremely challenging since the sensor needs to be in close contact with the element to be monitored, which imposes constraints in terms of packaging and materials. The strain measurement from a single position is valuable but monitoring the distribution of strain over the structure would increase this value many times over. This can be accomplished by using a distributed sensor network which would enable more advanced and effective analysis of the mechanical element. However, a network of nodes introduces challenges in terms of data collection and synchronization among nodes. In specific applications of interest, e.g. offshore infrastructures, the energy usage within the network also needs to be addressed at all levels.

In this presentation we will present a novel MEMS strain gauge sensor with a large potential for implementation into such sensor networks. We will cover the essentials of its design, packaging, and readout circuit. Some preliminary results from testing will be presented and we will address some of the challenges encountered.

Presented by Guido Sordo, Research Scientist at Department for Smart Sensors and Microsystems, SINTEF Digital

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